https://scholars.lib.ntu.edu.tw/handle/123456789/301816
Title: | Process Dependency of Radiation Hardness of Rapid Thermal Reoxidized Nitrided Gate Oxides | Authors: | JENN-GWO HWU | Issue Date: | 1993 | Journal Volume: | 40 | Journal Issue: | 9 | Start page/Pages: | 1597-1603 | Source: | IEEE Transactions on Electron Devices | URI: | http://www.scopus.com/inward/record.url?eid=2-s2.0-0027656851&partnerID=MN8TOARS http://scholars.lib.ntu.edu.tw/handle/123456789/301816 |
DOI: | 10.1109/16.231564 |
Appears in Collections: | 電機工程學系 |
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