Skip to main content
English
中文
Log In
Log in
Log in with ORCID
NTU Single Sign On
Have you forgotten your password?
Home
College of Electrical Engineering and Computer Science / 電機資訊學院
Electrical Engineering / 電機工程學系
Oxide-thickness-dependent suboxide width and its effect on inversion tunneling current
Details
Oxide-thickness-dependent suboxide width and its effect on inversion tunneling current
Journal
Journal of the Electrochemical Society
Journal Volume
151
Journal Issue
12
Date Issued
2004
Author(s)
JENN-GWO HWU
DOI
10.1149/1.1813653
URI
http://www.scopus.com/inward/record.url?eid=2-s2.0-10844250271&partnerID=MN8TOARS
http://scholars.lib.ntu.edu.tw/handle/123456789/307545
Type
journal article