https://scholars.lib.ntu.edu.tw/handle/123456789/307551| Title: | Improvement of Hot-Carrier and Radiation Hardnesses in Metal-Oxide-Nitride-Oxide Semiconductor Devices by Irradiation-Then-Anneal Treatments | Authors: | JENN-GWO HWU | Issue Date: | 1994 | Journal Volume: | 41 | Journal Issue: | 4 | Start page/Pages: | 612-614 | Source: | IEEE Transactions on Electron Devices | URI: | http://www.scopus.com/inward/record.url?eid=2-s2.0-0028417125&partnerID=MN8TOARS http://scholars.lib.ntu.edu.tw/handle/123456789/307551 |
DOI: | 10.1109/16.278518 |
| Appears in Collections: | 電機工程學系 |
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.