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College of Electrical Engineering and Computer Science / 電機資訊學院
Electrical Engineering / 電機工程學系
Computing System Failure Frequencies and Reliability Importance Measures using OBDD
Details
Computing System Failure Frequencies and Reliability Importance Measures using OBDD
Journal
IEEE Transactions on Computers
Journal Volume
53
Journal Issue
1
Pages
54-68
Date Issued
2004-01
Author(s)
Y. R. Chang
S. V. Amari
SY-YEN KUO
DOI
10.1109/TC.2004.1255790
URI
http://scholars.lib.ntu.edu.tw/handle/123456789/310544
Type
journal article
