https://scholars.lib.ntu.edu.tw/handle/123456789/310567| Title: | IC HTOL Test Stress Condition Optimization | Authors: | Peng, Brian Chen, Ing-Yi Kuo, Sy-Yen Bolger, Colin SY-YEN KUO |
Issue Date: | Oct-2004 | Start page/Pages: | 272-279 | Source: | 19th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT’04) | URI: | http://scholars.lib.ntu.edu.tw/handle/123456789/310567 | DOI: | 10.1109/DFTVS.2004.1347849 |
| Appears in Collections: | 電機工程學系 |
| File | Description | Size | Format | |
|---|---|---|---|---|
| 01347849.pdf | 355.11 kB | Adobe PDF | View/Open |
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