IC HTOL Test Stress Condition Optimization

Resource

Defect and Fault Tolerance in VLSI Systems, 2004. DFT 2004. Proceedings. 19th IEEE International Symposium on

Journal

19th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT’04)

Pages

272-279

Date Issued

2004-10

Author(s)

Peng, Brian

Chen, Ing-Yi

Kuo, Sy-Yen

Bolger, Colin

DOI

URI

Type

conference paper

File(s)

Name

01347849.pdf

Size

355.11 KB

Format

Adobe PDF

Checksum

(MD5):2ba0b6acea1e58829f3404106b37beb3