IC HTOL Test Stress Condition Optimization
Resource
Defect and Fault Tolerance in VLSI Systems, 2004. DFT 2004. Proceedings. 19th IEEE International Symposium on
Journal
19th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT’04)
Pages
272-279
Date Issued
2004-10
Author(s)
Type
conference paper
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01347849.pdf
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355.11 KB
Format
Adobe PDF
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(MD5):2ba0b6acea1e58829f3404106b37beb3