An Efficient Perfect Algorithm for Memory Repair Problems

Resource

Defect and Fault Tolerance in VLSI Systems, 2004. DFT 2004. Proceedings. 19th IEEE International Symposium on

Journal

19th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT’04)

Pages

306-313

Date Issued

2004-10

Author(s)

H. Y. Lin

I. Y. Chen

F. M. Yeh

DOI

URI

Type

conference paper

File(s)

Name

01347853.pdf

Size

705.54 KB

Format

Adobe PDF

Checksum

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