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College of Electrical Engineering and Computer Science / 電機資訊學院
Electronics Engineering / 電子工程學研究所
A Yield Improvement Methodology Using Pre- and Post-Silicon Statistical Clock Scheduling
Details
A Yield Improvement Methodology Using Pre- and Post-Silicon Statistical Clock Scheduling
Journal
IEEE/ACM International Conference on Computer-Aided Design (ICCAD)
Date Issued
2004-11
Author(s)
Jeng-Liang Tsai
DongHyun Baik
Charlie Chung-Ping Chen
Kewal K. Saluja
CHUNG-PING CHEN
DOI
10.1109/ICCAD.2004.1382649
URI
http://scholars.lib.ntu.edu.tw/handle/123456789/310833
Type
conference paper
