https://scholars.lib.ntu.edu.tw/handle/123456789/314244
Title: | Velocity overshoot effects and scaling issues in III-V nitrides | Authors: | Singh, M Wu, YR Singh, JP YUH-RENN WU |
Issue Date: | 2005 | Journal Volume: | 52 | Journal Issue: | 3 | Start page/Pages: | 311-316 | Source: | IEEE Transactions on Electron Devices | URI: | http://scholars.lib.ntu.edu.tw/handle/123456789/314244 | DOI: | 10.1109/TED.2005.843966 |
Appears in Collections: | 光電工程學研究所 |
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