https://scholars.lib.ntu.edu.tw/handle/123456789/314472| Title: | Temperature-induced voltage drop rearrangement and its effect on oxide breakdown in metal-oxide-semiconductor capacitor structure | Authors: | JENN-GWO HWU | Issue Date: | 2005 | Journal Volume: | 97 | Journal Issue: | 4 | Source: | Journal of Applied Physics | URI: | http://www.scopus.com/inward/record.url?eid=2-s2.0-13744261627&partnerID=MN8TOARS http://scholars.lib.ntu.edu.tw/handle/123456789/314472 |
DOI: | 10.1063/1.1850199 |
| Appears in Collections: | 電機工程學系 |
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