https://scholars.lib.ntu.edu.tw/handle/123456789/314474| Title: | Indication of lateral nonuniformity of effective oxide charges in hIGH-k gate dielectrics by TeRMAN's method | Authors: | JENN-GWO HWU | Issue Date: | 2005 | Journal Volume: | 1 | Journal Issue: | 5 | Start page/Pages: | 789-796 | Source: | ECS Transactions | URI: | http://www.scopus.com/inward/record.url?eid=2-s2.0-33845266461&partnerID=MN8TOARS http://scholars.lib.ntu.edu.tw/handle/123456789/314474 |
DOI: | 10.1149/1.2209324 |
| Appears in Collections: | 電機工程學系 |
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