https://scholars.lib.ntu.edu.tw/handle/123456789/314476
標題: | Radiation Hardness of Coplanar Submicron Gap Charge-Coupled Devices (CCD) with Rapid Thermal Nitrided Oxides | 作者: | JENN-GWO HWU | 公開日期: | 1995 | 卷: | 18 | 期: | 2 | 起(迄)頁: | 185-191 | 來源出版物: | Journal of the Chinese Institute of Engineers, Transactions of the Chinese Institute of Engineers,Series A/Chung-kuo Kung Ch'eng Hsuch K'an | URI: | http://www.scopus.com/inward/record.url?eid=2-s2.0-0029274162&partnerID=MN8TOARS http://scholars.lib.ntu.edu.tw/handle/123456789/314476 |
DOI: | 10.1080/02533839.1995.9677681 |
顯示於: | 電機工程學系 |
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