https://scholars.lib.ntu.edu.tw/handle/123456789/314480| Title: | Impurity-related interface trap in an Al/SiO2/Si(P) capacitor | Authors: | JENN-GWO HWU | Issue Date: | 1985 | Journal Volume: | 125 | Journal Issue: | 1-2 | Start page/Pages: | 17-23 | Source: | Thin Solid Films | URI: | http://www.scopus.com/inward/record.url?eid=2-s2.0-0021397771&partnerID=MN8TOARS http://scholars.lib.ntu.edu.tw/handle/123456789/314480 |
DOI: | 10.1016/0040-6090(85)90389-X |
| Appears in Collections: | 電機工程學系 |
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