https://scholars.lib.ntu.edu.tw/handle/123456789/316394
標題: | Operation lifetimes of organic light-emitting devices with different layer structures | 作者: | JIUN-HAW LEE JIAN-JANG HUANG Liao, Chi-Chih Hu, Pier-Jy Chang, Yih |
公開日期: | 二月-2005 | 卷: | 402 | 期: | 4-6 | 起(迄)頁: | 335 - 339 | 來源出版物: | Chemical Physics Letters | 摘要: | In this Letter, we present and analyze the operation lifetime behaviors of organic light-emitting devices by changing thicknesses of the hole-transport layer (HTL), the emitting layer (EML) and the electron transport layer (ETL). It is found that devices with higher power efficiency exhibit longer lifetimes. Given the same power efficiency, devices with a thicker HTL (or a thinner EML and ETL) have longer lifetimes. We also observe that, among different samples, the fixed charge density increasing rate near the HTL/EML interface is linearly correlated to the non-radiative center formation rate. © 2004 Elsevier B.V. All rights reserved. |
URI: | http://scholars.lib.ntu.edu.tw/handle/123456789/316394 https://www.scopus.com/inward/record.uri?eid=2-s2.0-12344290571&doi=10.1016%2fj.cplett.2004.12.050&partnerID=40&md5=2205fb5478185da7e21455802c1ef03e |
ISSN: | 00092614 | DOI: | 10.1016/j.cplett.2004.12.050 | SDG/關鍵字: | Correlation methods; Interfaces (materials); Thickness measurement; Electron transport layer (ETL); Emitting layer (EL); Hole-transport layer (HTL); Organic light emitting diodes; Light emitting diodes; article; correlation analysis; density; electricity; electron transport; light emitting diode; mathematical computing; thickness |
顯示於: | 光電工程學研究所 |
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