https://scholars.lib.ntu.edu.tw/handle/123456789/316394
DC 欄位 | 值 | 語言 |
---|---|---|
dc.contributor.author | JIUN-HAW LEE | en_US |
dc.contributor.author | JIAN-JANG HUANG | en_US |
dc.contributor.author | Liao, Chi-Chih | en_US |
dc.contributor.author | Hu, Pier-Jy | en_US |
dc.contributor.author | Chang, Yih | en_US |
dc.creator | Lee, Jiun-Haw;Huang, JianJang;Liao, Chi-Chih;Hu, Pier-Jy;Chang, Yih | - |
dc.date.accessioned | 2018-09-10T05:23:11Z | - |
dc.date.available | 2018-09-10T05:23:11Z | - |
dc.date.issued | 2005-02 | - |
dc.identifier.issn | 00092614 | - |
dc.identifier.uri | http://scholars.lib.ntu.edu.tw/handle/123456789/316394 | - |
dc.identifier.uri | https://www.scopus.com/inward/record.uri?eid=2-s2.0-12344290571&doi=10.1016%2fj.cplett.2004.12.050&partnerID=40&md5=2205fb5478185da7e21455802c1ef03e | - |
dc.description.abstract | In this Letter, we present and analyze the operation lifetime behaviors of organic light-emitting devices by changing thicknesses of the hole-transport layer (HTL), the emitting layer (EML) and the electron transport layer (ETL). It is found that devices with higher power efficiency exhibit longer lifetimes. Given the same power efficiency, devices with a thicker HTL (or a thinner EML and ETL) have longer lifetimes. We also observe that, among different samples, the fixed charge density increasing rate near the HTL/EML interface is linearly correlated to the non-radiative center formation rate. © 2004 Elsevier B.V. All rights reserved. | - |
dc.format | application/pdf | en |
dc.format.mimetype | application/pdf | - |
dc.language | en | en |
dc.relation | Chemical Physics Letters 402 (4-6): 335-339 | en |
dc.relation.ispartof | Chemical Physics Letters | - |
dc.source | AH-CrossRef Metadata Search | - |
dc.subject.other | Correlation methods; Interfaces (materials); Thickness measurement; Electron transport layer (ETL); Emitting layer (EL); Hole-transport layer (HTL); Organic light emitting diodes; Light emitting diodes; article; correlation analysis; density; electricity; electron transport; light emitting diode; mathematical computing; thickness | - |
dc.title | Operation lifetimes of organic light-emitting devices with different layer structures | - |
dc.type | journal article | en |
dc.identifier.doi | 10.1016/j.cplett.2004.12.050 | - |
dc.identifier.scopus | 2-s2.0-12344290571 | - |
dc.relation.pages | 335 - 339 | - |
dc.relation.journalvolume | 402 | - |
dc.relation.journalissue | 4-6 | - |
item.openairetype | journal article | - |
item.fulltext | no fulltext | - |
item.openairecristype | http://purl.org/coar/resource_type/c_6501 | - |
item.grantfulltext | none | - |
item.cerifentitytype | Publications | - |
crisitem.author.dept | Photonics and Optoelectronics | - |
crisitem.author.dept | Electrical Engineering | - |
crisitem.author.dept | Office of International Affairs | - |
crisitem.author.dept | Photonics and Optoelectronics | - |
crisitem.author.dept | Electrical Engineering | - |
crisitem.author.orcid | 0000-0003-3888-0595 | - |
crisitem.author.orcid | 0000-0002-5761-2177 | - |
crisitem.author.parentorg | College of Electrical Engineering and Computer Science | - |
crisitem.author.parentorg | College of Electrical Engineering and Computer Science | - |
crisitem.author.parentorg | Administrative Unit | - |
crisitem.author.parentorg | College of Electrical Engineering and Computer Science | - |
crisitem.author.parentorg | College of Electrical Engineering and Computer Science | - |
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