Impact of strain-temperature stress on ultrathin oxide

Journal

IEEE Transactions on Electron Devices

Journal Volume

53

Journal Issue

7

Pages

1736-1737

Date Issued

2006

Author(s)

Tung, C.-W.

Yang, Y.-L.

Hwu, J.-G.

DOI

10.1109/TED.2006.876273

URI

http://www.scopus.com/inward/record.url?eid=2-s2.0-33745728884&partnerID=MN8TOARS

http://scholars.lib.ntu.edu.tw/handle/123456789/321872

Type

journal article