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College of Electrical Engineering and Computer Science / 電機資訊學院
Electrical Engineering / 電機工程學系
Impact of strain-temperature stress on ultrathin oxide
Details
Impact of strain-temperature stress on ultrathin oxide
Journal
IEEE Transactions on Electron Devices
Journal Volume
53
Journal Issue
7
Pages
1736-1737
Date Issued
2006
Author(s)
Tung, C.-W.
Yang, Y.-L.
Hwu, J.-G.
JENN-GWO HWU
DOI
10.1109/TED.2006.876273
URI
http://www.scopus.com/inward/record.url?eid=2-s2.0-33745728884&partnerID=MN8TOARS
http://scholars.lib.ntu.edu.tw/handle/123456789/321872
Type
journal article