https://scholars.lib.ntu.edu.tw/handle/123456789/321884| Title: | Relationship between mobile charges and interface trap states in silicon mos capacitors | Authors: | Hwu, J.-G. Wang, W.-S. Chiou, Y.-L. JENN-GWO HWU |
Issue Date: | 1986 | Journal Volume: | 9 | Journal Issue: | 2 | Start page/Pages: | 171-178 | Source: | Journal of the Chinese Institute of Engineers, Transactions of the Chinese Institute of Engineers,Series A/Chung-kuo Kung Ch'eng Hsuch K'an | URI: | http://www.scopus.com/inward/record.url?eid=2-s2.0-0022678320&partnerID=MN8TOARS http://scholars.lib.ntu.edu.tw/handle/123456789/321884 |
DOI: | 10.1080/02533839.1986.9676875 |
| Appears in Collections: | 電機工程學系 |
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