Relationship between mobile charges and interface trap states in silicon mos capacitors

Journal

Journal of the Chinese Institute of Engineers, Transactions of the Chinese Institute of Engineers,Series A/Chung-kuo Kung Ch'eng Hsuch K'an

Journal Volume

9

Journal Issue

2

Pages

171-178

Date Issued

1986

Author(s)

Hwu, J.-G.

Wang, W.-S.

Chiou, Y.-L.

DOI

URI

Type

journal article