https://scholars.lib.ntu.edu.tw/handle/123456789/32500
標題: | Determining the Film Thickness and Probing the Interface Structure with Characteristic Scanning Tunneling Spectroscopy | 作者: | Lu, S.M. Shih, H.T. Jiang, C.L. Su, W.B. Chang, C.S. Tsong, Tien T. |
公開日期: | 八月-2006 | 出版社: | 臺北市:國立臺灣大學物理系所 | 卷: | VOL. 44 | 期: | NO. 4 | 起(迄)頁: | - | 來源出版物: | CHINESE JOURNAL OF PHYSICS | 摘要: | Structural and electronic properties of atomic-scale flat Ag films grown on Si(111)7×7 are investigated with scanning tunneling microscopy and spectroscopy. The spectrum for each film thickness reveals features of transmission resonance and standing-wave states. The spectral intensity or energy levels of these features vary with the film thickness, causing the spectrum for each thickness to exhibit a unique fingerprint-like aspect. The spectra can thus be used to discern the film thickness. In addition, the spectrum reveals a slight intensity variation with the change of location on the film. This variation is due to a phase change in the electronic reflection at the buried interface. Using this effect, the buried interfacial structure can be probed as well. |
URI: | http://ntur.lib.ntu.edu.tw//handle/246246/20060927115959398596 | 其他識別: | 20060927115959398596 |
顯示於: | 物理學系 |
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