射頻積體電路間連接結構之測試運作方法與具有測試結構之射頻積體電路,

Please use this identifier to cite or link to this item: https://scholars.lib.ntu.edu.tw/handle/123456789/325735

Title:	射頻積體電路間連接結構之測試運作方法與具有測試結構之射頻積體電路,
Authors:	TIAN-WEI HUANG
Issue Date:	Aug-2006
URI:	http://scholars.lib.ntu.edu.tw/handle/123456789/325735
Appears in Collections:	電信工程學研究所

Show full item record

checked on Jun 21, 2020

Check