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College of Electrical Engineering and Computer Science / 電機資訊學院
Communication Engineering / 電信工程學研究所
射頻積體電路間連接結構之測試運作方法與具有測試結構之射頻積體電路,
Details
射頻積體電路間連接結構之測試運作方法與具有測試結構之射頻積體電路,
Date Issued
2006-08
Author(s)
黃天偉
吳佩熹
蔡政翰
黃益群
TIAN-WEI HUANG
URI
http://scholars.lib.ntu.edu.tw/handle/123456789/325735
Type
patent