Capacitance Studies of Nd2Cu04
Resource
CHINESE JOURNAL OF PHYSICS, VOL. 34, NO. 2-11
Journal
CHINESE JOURNAL OF PHYSICS
Journal Volume
VOL. 34
Journal Issue
NO. 2-11
Pages
-
Date Issued
1996-04
Date
1996-04
Author(s)
Chen, J.W.
Wang, J.C.
Chen, Y.F.
DOI
20060927115953132733
Abstract
We have studied the dielectric properties of the sdsCu04 samples that were annealed
under different conditions by means of capacitance C(T,u) and dissipation factor
D(T,w) measurements with the test frequency (J in the range 20 Hz to 1 MHz and at
temperature T between 5 K and 325 K. \\:e observed two frequency-dependent peaks
in the D(T,c;) curves and corresponding features in the C(T,u) curevs. The first peak
occurs at T =: 230 K is due to the occurrence of the antiferromagnetic transition in
the sample and rhe second one occurs at T z 120 K is related to the change ol the
conduction mechanism in this system.
under different conditions by means of capacitance C(T,u) and dissipation factor
D(T,w) measurements with the test frequency (J in the range 20 Hz to 1 MHz and at
temperature T between 5 K and 325 K. \\:e observed two frequency-dependent peaks
in the D(T,c;) curves and corresponding features in the C(T,u) curevs. The first peak
occurs at T =: 230 K is due to the occurrence of the antiferromagnetic transition in
the sample and rhe second one occurs at T z 120 K is related to the change ol the
conduction mechanism in this system.
Publisher
臺北市:國立臺灣大學物理系所
Type
journal article
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