https://scholars.lib.ntu.edu.tw/handle/123456789/329944| Title: | Modeling and characterization of hydrogen-induced charge loss in nitride-trapping memory | Authors: | JENN-GWO HWU | Issue Date: | 2007 | Journal Volume: | 54 | Journal Issue: | 6 | Start page/Pages: | 1360-1365 | Source: | IEEE Transactions on Electron Devices | URI: | http://www.scopus.com/inward/record.url?eid=2-s2.0-34249932782&partnerID=MN8TOARS http://scholars.lib.ntu.edu.tw/handle/123456789/329944 |
DOI: | 10.1109/TED.2007.895242 |
| Appears in Collections: | 電機工程學系 |
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