https://scholars.lib.ntu.edu.tw/handle/123456789/329954| Title: | Direct Indication of Interface Trap States in an Mos Capacitor From the Peaks of Optical illumination-induced Capacitances | Authors: | JENN-GWO HWU | Issue Date: | 1987 | Journal Volume: | 10 | Journal Issue: | 4 | Start page/Pages: | 429-434 | Source: | Journal of the Chinese Institute of Engineers, Transactions of the Chinese Institute of Engineers,Series A/Chung-kuo Kung Ch'eng Hsuch K'an | URI: | http://www.scopus.com/inward/record.url?eid=2-s2.0-0023382989&partnerID=MN8TOARS http://scholars.lib.ntu.edu.tw/handle/123456789/329954 |
DOI: | 10.1080/02533839.1987.9676992 |
| Appears in Collections: | 電機工程學系 |
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