https://scholars.lib.ntu.edu.tw/handle/123456789/329955| Title: | Constant peak field distribution and voltage dropping in the oxide layer of a MOS capacitor during charge-temperature aging | Authors: | JENN-GWO HWU | Issue Date: | 1987 | Journal Volume: | 62 | Journal Issue: | 6 | Start page/Pages: | 849-856 | Source: | International Journal of Electronics | URI: | http://www.scopus.com/inward/record.url?eid=2-s2.0-0023365768&partnerID=MN8TOARS http://scholars.lib.ntu.edu.tw/handle/123456789/329955 |
DOI: | 10.1080/00207218708921037 |
| Appears in Collections: | 電機工程學系 |
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