https://scholars.lib.ntu.edu.tw/handle/123456789/330307
Title: | Residual thermal strain in thick GaN epifilms revealed by cross-sectional Raman scattering and cathodoluminescence spectra | Authors: | Wang, F.C. Cheng, C.L. Chen, Y.F. Huang, C.F. Yang, C.C. YANG-FANG CHEN CHIH-CHUNG YANG |
Issue Date: | 2007 | Journal Volume: | 22 | Journal Issue: | 8 | Start page/Pages: | 896-899 | Source: | Semiconductor Science and Technology | URI: | http://www.scopus.com/inward/record.url?eid=2-s2.0-34547407201&partnerID=MN8TOARS http://scholars.lib.ntu.edu.tw/handle/123456789/330307 |
DOI: | 10.1088/0268-1242/22/8/012 |
Appears in Collections: | 電機工程學系 |
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.