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College of Electrical Engineering and Computer Science / 電機資訊學院
Photonics and Optoelectronics / 光電工程學研究所
Stability of amorphous silicon thin film transistors under prolonged high compressive strain
Details
Stability of amorphous silicon thin film transistors under prolonged high compressive strain
Journal
Materials Research Society Symposium
Journal Volume
989
Pages
205-209
Date Issued
2007
Author(s)
Chen, J.-Z.
Cheng, I.-C.
Wagner, S.
Jackson, W.
Perlov, C.
Taussig, C.
I-CHUN CHENG
URI
http://www.scopus.com/inward/record.url?eid=2-s2.0-41549123311&partnerID=MN8TOARS
http://scholars.lib.ntu.edu.tw/handle/123456789/332092
Type
conference paper
