Skip to main content
English
中文
Log In
Log in
Log in with ORCID
NTU Single Sign On
Have you forgotten your password?
Home
College of Electrical Engineering and Computer Science / 電機資訊學院
Electronics Engineering / 電子工程學研究所
A new interference phenomenon in sub-60nm nitride-based flash memory
Details
A new interference phenomenon in sub-60nm nitride-based flash memory
Journal
22nd IEEE Non-Volatile Semiconductor Memory Workshop
Pages
81-82
Date Issued
2007
Author(s)
YAO-WEN CHANG
DOI
10.1109/NVSMW.2007.4290590
URI
http://www.scopus.com/inward/record.url?eid=2-s2.0-48649083510&partnerID=MN8TOARS
http://scholars.lib.ntu.edu.tw/handle/123456789/332287
Type
conference paper