Cyclic-CPRS : A Diagnosis Technique for BISTed Circuits for Nano-meter Technologies
Journal
IEEE Asian South Pacific Design Automation Conference (ASP-DAC)
Pages
835-840
Start Page
835
End Page
840
Date Issued
2007-01
Author(s)
Event(s)
ASP-DAC 2007 - Asia and South Pacific Design Automation Conference 2007
Type
conference paper