https://scholars.lib.ntu.edu.tw/handle/123456789/338629| Title: | Lateral nonuniformity effects of border traps on the characteristics of metal-oxide-semiconductor field-effect transistors subjected to high-field stresses | Authors: | Tseng, J.-C. Hwu, J.-G. JENN-GWO HWU |
Issue Date: | 2008 | Journal Volume: | 55 | Journal Issue: | 6 | Start page/Pages: | 1366-1372 | Source: | IEEE Transactions on Electron Devices | URI: | http://www.scopus.com/inward/record.url?eid=2-s2.0-44949250062&partnerID=MN8TOARS http://scholars.lib.ntu.edu.tw/handle/123456789/338629 |
DOI: | 10.1109/TED.2008.922489 |
| Appears in Collections: | 電機工程學系 |
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