https://scholars.lib.ntu.edu.tw/handle/123456789/338638
Title: | C-V hysteresis instability in aluminum/tantalum oxide/silicon oxide/silicon capacitors due to postmetallization annealing and Co-60 irradiation | Authors: | Hwu, Jenn-Gwo Jeng, Ming-Jer JENN-GWO HWU |
Issue Date: | 1988 | Journal Volume: | 135 | Journal Issue: | 11 | Start page/Pages: | 2808-2813 | Source: | Journal of the Electrochemical Society | URI: | http://www.scopus.com/inward/record.url?eid=2-s2.0-0024106111&partnerID=MN8TOARS http://scholars.lib.ntu.edu.tw/handle/123456789/338638 |
DOI: | 10.1149/1.2095437 |
Appears in Collections: | 電機工程學系 |
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.