https://scholars.lib.ntu.edu.tw/handle/123456789/340883| Title: | Characterization of Si nanorods by spectroscopic ellipsometry with efficient theoretical modeling | Authors: | Hsu, S.-H. Liu, E.-S. Chang, Y.-C. Hilfiker, J.N. Kim, Y.D. Kim, T.J. Lin, C.-J. Lin, G.-R. GONG-RU LIN Lin, Chun-Jung |
Issue Date: | 2008 | Journal Volume: | 205 | Journal Issue: | 4 | Start page/Pages: | 876-879 | Source: | Physica Status Solidi (A) Applications and Materials Science | URI: | http://www.scopus.com/inward/record.url?eid=2-s2.0-54849421851&partnerID=MN8TOARS http://scholars.lib.ntu.edu.tw/handle/123456789/340883 |
DOI: | 10.1002/pssa.200777832 |
| Appears in Collections: | 光電工程學研究所 |
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