https://scholars.lib.ntu.edu.tw/handle/123456789/341020| Title: | Sensitivity-based multiple-Vt cell swapping for leakage power reduction | Authors: | Lee, W.-P. Liu, H.-Y. Ho, K.-H. Chang, Y.-W. YAO-WEN CHANG |
Issue Date: | 2008 | Start page/Pages: | 168-171 | Source: | 2008 International Symposium on VLSI Design, Automation, and Test, VLSI-DAT | URI: | http://www.scopus.com/inward/record.url?eid=2-s2.0-50649119502&partnerID=MN8TOARS http://scholars.lib.ntu.edu.tw/handle/123456789/341020 |
DOI: | 10.1109/VDAT.2008.4542439 |
| Appears in Collections: | 電子工程學研究所 |
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