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College of Electrical Engineering and Computer Science / 電機資訊學院
Electronics Engineering / 電子工程學研究所
Sensitivity-based multiple-Vt cell swapping for leakage power reduction
Details
Sensitivity-based multiple-Vt cell swapping for leakage power reduction
Journal
2008 International Symposium on VLSI Design, Automation, and Test, VLSI-DAT
Pages
168-171
Date Issued
2008
Author(s)
Lee, W.-P.
Liu, H.-Y.
Ho, K.-H.
YAO-WEN CHANG
DOI
10.1109/VDAT.2008.4542439
URI
http://www.scopus.com/inward/record.url?eid=2-s2.0-50649119502&partnerID=MN8TOARS
http://scholars.lib.ntu.edu.tw/handle/123456789/341020
Type
conference paper