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College of Electrical Engineering and Computer Science / 電機資訊學院
Electronics Engineering / 電子工程學研究所
Metal-density driven placement for CMP variation and routability
Details
Metal-density driven placement for CMP variation and routability
Journal
International Symposium on Physical Design
Pages
31-38
Date Issued
2008
Author(s)
Chen, T.-C.
Cho, M.
Pan, D.Z.
YAO-WEN CHANG
DOI
10.1145/1353629.1353638
URI
http://www.scopus.com/inward/record.url?eid=2-s2.0-43349106266&partnerID=MN8TOARS
http://scholars.lib.ntu.edu.tw/handle/123456789/341030
Type
conference paper