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College of Electrical Engineering and Computer Science / 電機資訊學院
Electrical Engineering / 電機工程學系
QBIST: 1-Testable Quantum Built-In Self-Test for any Boolean Circuit
Details
QBIST: 1-Testable Quantum Built-In Self-Test for any Boolean Circuit
Journal
26th IEEE VLSI Test Symposium (VTS'08)
Pages
261-266
Date Issued
2008-04
Author(s)
Y. H. Chou
I. M. Tsai
SY-YEN KUO
DOI
10.1109/VTS.2008.49
URI
http://scholars.lib.ntu.edu.tw/handle/123456789/342611
Type
conference paper
