Diagnosis of Multiple Scan Chain Timing Faults

Journal

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

Journal Volume

27

Journal Issue

6

Pages

1104-1116

Date Issued

2008-01

Author(s)

W.S. Chuang

DOI

10.1109/TCAD.2008.923258

URI

http://scholars.lib.ntu.edu.tw/handle/123456789/343001

Type

journal article