Efficient test-point selection for scan-based BIST

Journal

IEEE Transactions on Very Large Scale Integration (VLSI) Systems

Journal Volume

6

Journal Issue

4

Pages

667-676

Date Issued

1998

Author(s)

Tsai, H.-C.

Cheng, K.-T.

Lin, C.-J.

Bhawmik, S.

DOI

10.1109/92.736140

URI

http://www.scopus.com/inward/record.url?eid=2-s2.0-0032297062&partnerID=MN8TOARS

http://scholars.lib.ntu.edu.tw/handle/123456789/343216

Type

journal article