https://scholars.lib.ntu.edu.tw/handle/123456789/343216| Title: | Efficient test-point selection for scan-based BIST | Authors: | Tsai, H.-C. Cheng, K.-T. Lin, C.-J. Bhawmik, S. CHIH-JEN LIN |
Issue Date: | 1998 | Journal Volume: | 6 | Journal Issue: | 4 | Start page/Pages: | 667-676 | Source: | IEEE Transactions on Very Large Scale Integration (VLSI) Systems | URI: | http://www.scopus.com/inward/record.url?eid=2-s2.0-0032297062&partnerID=MN8TOARS http://scholars.lib.ntu.edu.tw/handle/123456789/343216 |
DOI: | 10.1109/92.736140 |
| Appears in Collections: | 資訊工程學系 |
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