https://scholars.lib.ntu.edu.tw/handle/123456789/347704
Title: | Characteristics and reliability of hafnium oxide dielectric stacks with room temperature grown interfacial anodic oxide | Authors: | Chang, C.-H. Hwu, J.-G. JENN-GWO HWU |
Issue Date: | 2009 | Journal Volume: | 9 | Journal Issue: | 2 | Start page/Pages: | 215-221 | Source: | IEEE Transactions on Device and Materials Reliability | URI: | http://www.scopus.com/inward/record.url?eid=2-s2.0-67650333622&partnerID=MN8TOARS http://scholars.lib.ntu.edu.tw/handle/123456789/347704 |
DOI: | 10.1109/TDMR.2008.2012057 |
Appears in Collections: | 電機工程學系 |
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