https://scholars.lib.ntu.edu.tw/handle/123456789/348155
Title: | Cell-based interconnection network design and the all-pairs examination problem | Authors: | JA-LING WU | Issue Date: | 1989 | Journal Volume: | 67 | Journal Issue: | 4 | Start page/Pages: | 503-512 | Source: | International Journal of Electronics | Abstract: | A systematic procedure for the design of VLSI cell-based interconnection networks is proposed through the concept of the all-pairs examination problem. Since there are no line intersections between the intermodular interconnections of the proposed network, it is very suitable for planar VLSI implementation. © 1989 Taylor & Francis Ltd. |
URI: | http://www.scopus.com/inward/record.url?eid=2-s2.0-0024746155&partnerID=MN8TOARS http://scholars.lib.ntu.edu.tw/handle/123456789/348155 |
DOI: | 10.1080/00207218908921104 | SDG/Keyword: | All-Pairs Examination Problem; Cell-Based Interconnection Network Design; Merging Process; Planar VLSI; Switching Functions; Integrated Circuits, VLSI; article; electronics |
Appears in Collections: | 資訊工程學系 |
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.