https://scholars.lib.ntu.edu.tw/handle/123456789/350191
Title: | Correlation of carrier lifetimes and arsenic-antisite defects in LT-GaAs grown at different substrate temperatures | Authors: | Lin, Gong-Ru Liu, Tze-An Pan, Ci-Ling GONG-RU LIN |
Issue Date: | 1999 | Journal Volume: | 3624 | Start page/Pages: | 50-56 | Source: | Proceedings of SPIE - The International Society for Optical Engineering | URI: | http://www.scopus.com/inward/record.url?eid=2-s2.0-0032596931&partnerID=MN8TOARS http://scholars.lib.ntu.edu.tw/handle/123456789/350191 |
Appears in Collections: | 光電工程學研究所 |
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