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College of Electrical Engineering and Computer Science / 電機資訊學院
Electrical Engineering / 電機工程學系
Improved SPICE macromodel of phase change random access memory
Details
Improved SPICE macromodel of phase change random access memory
Journal
2009 International Symposium on VLSI Design, Automation and Test
Pages
134-137
Date Issued
2009
Author(s)
CHEE-WEE LIU
Chang, H.-L.
Chang, H.-C.
Yang, S.-C.
Tsai, H.-C.
Li, H.-C.
CHEE-WEE LIU
DOI
10.1109/VDAT.2009.5158113
URI
http://www.scopus.com/inward/record.url?eid=2-s2.0-77950633502&partnerID=MN8TOARS
http://scholars.lib.ntu.edu.tw/handle/123456789/350484
Type
conference paper