https://scholars.lib.ntu.edu.tw/handle/123456789/350489
Title: | Dynamic bias temperature instability of p-channel polycrystalline silicon thin-film transistors | Authors: | CHEE-WEE LIU Huang, C.-F. Sun, H.-C. Kuo, P.-S. Chen, Y.-T. Liu, C.W. Hsu, Y.-J. Chen, J.-S. CHEE-WEE LIU |
Issue Date: | 2009 | Start page/Pages: | 158-162 | Source: | International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA | URI: | http://www.scopus.com/inward/record.url?eid=2-s2.0-71049150151&partnerID=MN8TOARS http://scholars.lib.ntu.edu.tw/handle/123456789/350489 |
DOI: | 10.1109/IPFA.2009.5232678 |
Appears in Collections: | 電機工程學系 |
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