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College of Electrical Engineering and Computer Science / 電機資訊學院
Electrical Engineering / 電機工程學系
Comprehensive study of the Raman shifts of strained silicon and germanium
Details
Comprehensive study of the Raman shifts of strained silicon and germanium
Journal
Journal of Applied Physics
Journal Volume
105
Journal Issue
8
Date Issued
2009
Author(s)
CHEE-WEE LIU
Peng, C.-Y.
Huang, C.-F.
Fu, Y.-C.
YI-HSUAN YANG
Lai, C.-Y.
Chang, S.-T.
CHEE-WEE LIU
DOI
10.1063/1.3110184
URI
http://www.scopus.com/inward/record.url?eid=2-s2.0-65449163369&partnerID=MN8TOARS
http://scholars.lib.ntu.edu.tw/handle/123456789/350491
Type
journal article