https://scholars.lib.ntu.edu.tw/handle/123456789/350712
DC 欄位 | 值 | 語言 |
---|---|---|
dc.contributor.author | Lin, S.-Y. | en_US |
dc.contributor.author | Hsu, C.-C. | en_US |
dc.contributor.author | Wu, A.-Y. | en_US |
dc.contributor.author | AN-YEU(ANDY) WU | zz |
dc.creator | Lin, S.-Y.;Hsu, C.-C.;Wu, A.-Y. | - |
dc.date.accessioned | 2018-09-10T07:37:59Z | - |
dc.date.available | 2018-09-10T07:37:59Z | - |
dc.date.issued | 2009 | - |
dc.identifier.uri | http://www.scopus.com/inward/record.url?eid=2-s2.0-70350170720&partnerID=MN8TOARS | - |
dc.identifier.uri | http://scholars.lib.ntu.edu.tw/handle/123456789/350712 | - |
dc.language | en | en |
dc.relation.ispartof | IEEE International Symposium on Circuits and Systems | - |
dc.source | AH-Scopus to ORCID | - |
dc.title | A scalable built-in self-test/self-diagnosis architecture for 2D-mesh based chip multiprocessor systems | - |
dc.type | conference paper | en |
dc.identifier.doi | 10.1109/ISCAS.2009.5118263 | - |
dc.relation.pages | 2317-2320 | - |
item.fulltext | no fulltext | - |
item.grantfulltext | none | - |
item.openairetype | conference paper | - |
item.openairecristype | http://purl.org/coar/resource_type/c_5794 | - |
item.cerifentitytype | Publications | - |
crisitem.author.dept | Electrical Engineering | - |
crisitem.author.dept | Electronics Engineering | - |
crisitem.author.dept | Intel-NTU Connected Context Computing Center | - |
crisitem.author.dept | Center for Artificial Intelligence and Advanced Robotics | - |
crisitem.author.orcid | 0000-0003-4731-8633 | - |
crisitem.author.parentorg | College of Electrical Engineering and Computer Science | - |
crisitem.author.parentorg | College of Electrical Engineering and Computer Science | - |
crisitem.author.parentorg | Others: University-Level Research Centers | - |
crisitem.author.parentorg | Others: International Research Centers | - |
crisitem.author.parentorg | Others: University-Level Research Centers | - |
顯示於: | 電機工程學系 |
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