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College of Electrical Engineering and Computer Science / 電機資訊學院
Electronics Engineering / 電子工程學研究所
Time-space test response compaction and diagnosis based on BCH codes
Details
Time-space test response compaction and diagnosis based on BCH codes
Journal
IET Computers & Digital Techniques
Journal Volume
3
Journal Issue
3
Pages
304-313
Date Issued
2009-05
Author(s)
CHIEN-MO LI
F. M. Wang
W.-C. Wang
CHIEN-MO LI
DOI
10.1049/iet-cdt.2008.0066
URI
http://scholars.lib.ntu.edu.tw/handle/123456789/352487
Type
journal article
