https://scholars.lib.ntu.edu.tw/handle/123456789/357983
Title: | Reliability screening of a-Si TFT circuits: Very-low voltage and I <inf>DDQ</inf> Testing | Authors: | Shen, S.-T. Liu, C. Ma, E.-H. Cheng, I.-C. Li, J.C.-M. I-CHUN CHENG CHIEN-MO LI |
Issue Date: | 2010 | Journal Volume: | 6 | Journal Issue: | 12 | Start page/Pages: | 592-600 | Source: | IEEE/OSA Journal of Display Technology | URI: | http://www.scopus.com/inward/record.url?eid=2-s2.0-78449309721&partnerID=MN8TOARS http://scholars.lib.ntu.edu.tw/handle/123456789/357983 |
DOI: | 10.1109/JDT.2010.2060469 |
Appears in Collections: | 光電工程學研究所 |
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