https://scholars.lib.ntu.edu.tw/handle/123456789/358240| Title: | Threshold voltage and mobility extraction of NBTI degradation of poly-Si thin-film transistors | Authors: | Sun, H.-C. Huang, C.-F. Chen, Y.-T. Wu, T.-Y. Liu, C.W. Hsu, Y.-J. Chen, J.-S. CHEE-WEE LIU |
Issue Date: | 2010 | Journal Volume: | 57 | Journal Issue: | 11 | Start page/Pages: | 3186-3189 | Source: | IEEE Transactions on Electron Devices | URI: | http://www.scopus.com/inward/record.url?eid=2-s2.0-78049303984&partnerID=MN8TOARS http://scholars.lib.ntu.edu.tw/handle/123456789/358240 |
DOI: | 10.1109/TED.2010.2068550 |
| Appears in Collections: | 電機工程學系 |
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