https://scholars.lib.ntu.edu.tw/handle/123456789/363038| Title: | Area dependent deep depletion behavior in the capacitance-voltage characteristics of metal-oxide-semiconductor structures with ultra-thin oxides | Authors: | Chen, K.-M. Hwu, J.-G. JENN-GWO HWU |
Issue Date: | 2011 | Journal Volume: | 110 | Journal Issue: | 11 | Source: | Journal of Applied Physics | URI: | http://www.scopus.com/inward/record.url?eid=2-s2.0-84859372155&partnerID=MN8TOARS http://scholars.lib.ntu.edu.tw/handle/123456789/363038 |
DOI: | 10.1063/1.3664767 |
| Appears in Collections: | 電機工程學系 |
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