Charge confinement in silicon nanowires by surface functionalization

Journal

2011 NSTI Nanotechnology Conference and Expo

Journal Volume

1

Pages

484-487

Date Issued

2011

Author(s)

Shih, Y.C.

Lee, J.H.

Lin, C.T.

Chen, C.S.

Wu, K.C.

URI

http://www.scopus.com/inward/record.url?eid=2-s2.0-81455133704&partnerID=MN8TOARS

http://scholars.lib.ntu.edu.tw/handle/123456789/364521

Type

conference paper