https://scholars.lib.ntu.edu.tw/handle/123456789/364765
標題: | Quality assessment for LiDAR point cloud registration using in-situ conjugate features | 作者: | CHIH-TING LIN Han, Jen-Yu Tserng, Hui-Ping |
關鍵字: | Light Detection and Ranging; parameter estimation; point registration; quality assessment | 公開日期: | 2011 | 起(迄)頁: | 4122-4125 | 來源出版物: | International Geoscience and Remote Sensing Symposium | 摘要: | This study aims to develop a quantitative approach for evaluating the quality of a LiDAR point cloud registration solution. First, a highly-efficient technique for integrating multiple LiDAR point clouds was introduced using directly the in-situ conjugate features (including point, linear, planar features and groups of points). Then by applying the Non-Iterative Solutions for Linear Transformations (NISLT) technique, the transformation between datasets can be directly solved without carrying out iterative computations or using any prior initial information. The weighted model for the observables was also developed to improve the reliability of obtained solutions. Finally, two quality indexes, namely the absolute consistency and relative geometric similarity, were proposed to give complete and realistic information on the quality of the integrated solutions. A case study for a real-field facility has also been performed to reveal the distinguishing capability and superiority of this newly-developed technique. © 2011 IEEE. |
URI: | https://www.scopus.com/inward/record.uri?eid=2-s2.0-80955141912&doi=10.1109%2fIGARSS.2011.6050140&partnerID=40&md5=ba78991e6425c8cf642c877e4fa5626b | DOI: | 10.1109/IGARSS.2011.6050140 | SDG/關鍵字: | Data sets; Geometric similarity; In-situ; Initial information; Integrated solutions; Iterative computation; Light detection and ranging; Non-iterative; Point cloud; Point cloud registration; point registration; quality assessment; Quality indices; Quantitative approach; Weighted models; Geology; Linear transformations; Mathematical transformations; Parameter estimation; Remote sensing; Surface measurement; Optical radar |
顯示於: | 電子工程學研究所 |
在 IR 系統中的文件,除了特別指名其著作權條款之外,均受到著作權保護,並且保留所有的權利。