High-resolution electronic interferometry for the measurement of in-plane vibration

Journal

Applied Optics

Journal Volume

51

Journal Issue

24

Pages

5773-5779

Date Issued

2012

Author(s)

Chang, C.-Y.

Lin, S.-H.

DOI

10.1364/AO.51.005773

URI

http://www.scopus.com/inward/record.url?eid=2-s2.0-84865594523&partnerID=MN8TOARS

http://scholars.lib.ntu.edu.tw/handle/123456789/370803

Type

journal article