https://scholars.lib.ntu.edu.tw/handle/123456789/372795| Title: | 4H-SiC wafers studied by X-ray absorption and Raman scattering | Authors: | CHEE-WEE LIU | Issue Date: | 2012 | Journal Volume: | 717-720 | Start page/Pages: | 509-512 | Source: | Materials Science Forum | URI: | http://www.scopus.com/inward/record.url?eid=2-s2.0-84861380304&partnerID=MN8TOARS http://scholars.lib.ntu.edu.tw/handle/123456789/372795 |
DOI: | 10.4028/www.scientific.net/MSF.717-720.509 |
| Appears in Collections: | 電機工程學系 |
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